Performance Evaluation of First and Second-order Incremental A/D Converters

Abstract

This paper presents the design of first and second-order incremental analog-to-digital converters (ADCs). The characteristics of converters are extremely wide from Giga samples to a few samples per second for bandwidth and resolution variation from a few bits to more than 20 bits. Delta sigma converters are most commonly used high-resolution A/D converters. In instrumentation and measurement applications, the continuous operation, the large offset and inaccurate gain of delta-sigma does not satisfy the specifications. The incremental converters are also based on delta-sigma architecture but work in transient mode are more adapted.