Complex Permittivity of Dielectric Substrate Measurements Using Ring Resonator
Abstract
In this paper, we are going to present a methodology which is more suitable and easy to measure complex permittivity of dielectric substrates using ring resonator of a planar circuits. Mainly it is based on the transmission type ring resonator with capacity coupling. On adjusting base resonant frequency of a ring resonator we can measure the dielectric constant and dissipation factor at wide frequency band and the remaining parameters can simplified or verified according to the information in this paper.
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Vorlíček J, Vrba J. Coaxial Probe for Measuring Complex Permittivity of Biological Tissues. In 25th Annual Meeting of the European Society for Hyperthermic Oncology - Abstract Book. Verona: Ospedale Borgo Trento, U.O. Radioterapie, 2009; 59p.
Suzuki H. Microwave Measurement of Complex Permittivity by Placing a Microstripline Resonator on the Material under Test. Proceedings of the 36th European Microwave Conference, Manchester 2006.
Heinola JM, Utti KP, Strom JP, et al. A strip line ring resonator method for determination of dielectric properties of printed circuit board material in function of frequency, 2004 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2004.
Svačina, J. Řešení mikrovlnných planárních struktur metodou konformního zobrazení. Akademické nakladatelství, CERN, 2006.
DOI: https://doi.org/10.37591/jomet.v2i2.5344
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