Author Details

Tripathi, Bharat, Department of VLSI Design, Institute of Technology and Management, Gwalior, Madhya Pradesh, India, India

  • Vol 7, No 3 (2017) - Articles
    Performance Analysis of 3T DRAM Using FinFET Based with Leakage Reduction Techniques at 45 nm Technology
    Abstract  PDF
  • Vol 7, No 2 (2017) - Articles
    Performance Analysis of 3T DRAM Using FinFET Based with Leakage Reduction Techniques at 45 nm Technology
    Abstract