lavania, shilpi, Hindustan College of Science & Technology, Farah, Mathura, India Moti Lal Nehru National Institute of Technology, Allahabad, India
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Vol 1, No 1-2-3 (2011) - Articles
An Explicit Approach to Compare Crosstalk Noise and Delay in VLSI RLC Interconnect Modeled with Skin Effect with Step and Ramp Input
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eISSN: 2249–474X